autores Alpuim, P. Correia, V. Sencadas, V. Martins, Marcos Silva Ribeiro, Clarisse Marta Oliveira José Gerardo Rocha Iñigo, Morales Atieza, Carlos Clarisse Ribeiro
palavras-chave Low temperature poly-Si Nanocrystalline Si Piezoresistive poly-Si Prosthesis monitoring Stress mapping