autores Belsley, M. Eduardo J Nunes-Pereira Belsley, M. Ferreira, Flávio Pedro Gonçalves Fernandes Forte, P.M.F. Felgueiras, P.E.R. Boris P. J. Bret Yakov G. Soskind Craig Olson
palavras-chave AOI Automatic Optical Inspection Optical Metrology Quality Control Shannon-Nyquist fractional defects