autores Cerqueira, María de Fátima L Rebouta Martin Andritschky Cerqueira, M.F. Ferreira, J. A. Andritschky, M Silva, M. F. Cerqueira, M. F. Rebouta, L Andritschky, M. Ferreira, J.A. Da Silva, M.F. Rebouta, L.
palavras-chave Hydrogenated microcrystalline silicon Magnetron sputtering Raman spectroscopy X-ray diffraction
Digital Object Identifier (DOI) https://doi.org/10.1016/0042-207x(95)00158-1 https://doi.org/10.1016/0042-207x(95)00158-1