On the formation of an interface amorphous layer in nanostructured ferroelectric Ba0.8Sr0.2TiO3 thin films integrated on Pt-Si and its effect on the electrical properties J. P. B. Silva, K. C. Sekhar, S. A. S. Rodrigues, M. Pereira, A. Parisini, E. Alves;N. Barradas, M. J. M. Gomes. E-MRS 2012 Spring Meeting Conference, Symposium V: Laser materials processing for micro and nano applications uri icon

autores

  • Maria de Jesus de Matos Gomes

data de publicação

  • janeiro 1, 2012