Influence of RF-sputtering power on formation of vertically stacked Si 1-xGex nanocrystals between ultra-thin amorphous Al 2O3 layers: Structural and photoluminescence properties uri icon

resumo

  • The authors would like to thank Professor David J Barber (University of Essex) for his helpful discussions and critical reading of this manuscript, and Engineer José Santos for technical support at Thin Film Laboratory.

autores

  • E M F Vieira
  • Maria de Jesus de Matos Gomes
  • Rolo, Anabela G.
  • Barradas, N. P.
  • Vieira, E.M.F.
  • Franco, Nuno
  • Martín-Sánchez, J.
  • Correia, M. R.
  • Roldan, M.A.
  • Varela, M.
  • Buljan, M.
  • Pennycook, S. J.
  • Bernstorff, S.
  • Molina, S. I.
  • Alves, E.
  • Barradas, N.P.
  • Aksoy-Aksel, A.
  • Chahboun, A.
  • Vieira, E. M. F
  • Gomes, M. J. M.
  • Martín-Sánchez, J.
  • Roldan, M. A.
  • Varela, M.
  • Buljan, M.
  • Bernstorff, S.

data de publicação

  • janeiro 1, 2013