S. R. C. Pinto, A. G. Rolo, A. Chahboun and M. J. M. Gomes. Annealing effect on the properties of Ge nanocrystals dispersed in alumina films by means of TEM and ellipsometry. 1st European School on Ellipsometry. 21 - 25 September, 2008, Ostuni, Italy.
- Visão geral
Visão geral
data de publicação
- janeiro 1, 2008