Study of the piezoresistivity of doped nanocrystalline silicon thin films uri icon

autores

  • Alpuim, P.
  • Vasilevskiy, Mikhail
  • Alpuim, P.
  • Paul, O.
  • Alpuim, P.
  • Gaspar, J.
  • Gaspar, J.
  • Gieschke, P.
  • Ehling, C.
  • Gieschke, P.
  • Ehling, C.
  • Kistner, J.
  • Gonalves, N.J.
  • Kistner, J.
  • Gonçalves, N. J.
  • Vasilevskiy, M.I.
  • Paul, O.

data de publicação

  • janeiro 1, 2011