autores Anibal Guedes C.J. Tavares Simoes, Sonia Ana Soares Simões, S. Soares, A. Tavares, C.J. Guedes, A.
publicada em Microscopy and Microanalysis Revista Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Revista
palavras-chave Brazing Electron microscopy Energy-dispersive X-ray spectroscopy Microstructural characterization Tial alloys
Digital Object Identifier (DOI) https://doi.org/10.1017/s1431927618015295 https://doi.org/10.1017/s1431927618015295