Structural and electrical studies of ultrathin layers with Si 0.7Ge 0.3 nanocrystals confined in a SiGe/SiO 2 superlattice uri icon

resumo

  • The authors would like also to thank José Santos for technical support.

autores

  • E M F Vieira
  • Maria de Jesus de Matos Gomes
  • Rolo, Anabela G.
  • Vieira, E. M. F.
  • Capan, I.
  • Martín-Sánchez, J.
  • Alves, E.
  • Barradas, N. P.
  • Parisini, A.
  • Buljan, M.
  • Conde, Olinda
  • Bernstorff, S.
  • Capan, I.
  • Chahboun, A.
  • Aksoy-Aksel, A.
  • Levichev, S.
  • Vieira, E. M. F
  • Gomes, M. J. M.
  • Martín-Sánchez, J.

data de publicação

  • janeiro 1, 2012