autores Cerqueira, María de Fátima Cerqueira, M.F. Stepikhova, M. Losurdo, M. Giangregorio, M.M. Kozanecki, A. Monteiro, T.
palavras-chave Ellipsometry Erbium doping Photoluminescence Silicon nanocrystals nc-Si optical properties spectroscopic ellipsometry thin films