autores Maria de Jesus de Matos Gomes Chahboun, A. Sekhar, K.C. Levichev, S. Sekhar, K. C. Kamakshi, K. Levichev, S. Doyle, S. Kamakshi, K. Chahboun, A. Gomes, M. J. M. Doyle, B. Gomes, M.J.M.
palavras-chave Electrical properties Grazing incidence x-ray diffraction Photoluminescence Rapid thermal annealing ZnO thin films