resumo The authors would like to thank Professor David Barber (University of Essex) for his helpful discussions and critical reading of this manuscript, and Engineer José Santos for technical support at Thin Film Laboratory.
autores Rolo, Anabela G. E M F Vieira Chahboun, A. Levichev, S. Carlos Dias Gomes, M. J. M. Igreja, Rui Buljan, M. Vieira, E. M. F Bernstorff, S. Levichev, S. Conde, Olinda Aksoy-Aksel, A. Buljan, M. Bernstorff, S.
palavras-chave Capacitance-voltage Charge storage Conductance-voltage MOS nanostructure Memory effect Nanocrystals RF sputtering SiGe