Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers Artigo Académico uri icon

autores

  • Šics, I.
  • Nogales, A.
  • Ezquerra, T.A.
  • Denchev Zlatan Zlatev
  • Baltá-Calleja, F.J.
  • Meyer, A.
  • Döhrmann, R.

data de publicação

  • janeiro 1, 2000