s-d electron scattering as a sensitive probe to study Fe/Cr multilayer structural differences (MBE/sputtered samples) Artigo Académico uri icon

autores

  • Almeida
  • Almeida, B.G.
  • Sousa, J.B.
  • Colino, J.
  • Schuller, Y.
  • Schad, R.
  • Moshchalkov, V.V.
  • Bruynseraede, Y.

data de publicação

  • janeiro 1, 1996