Annealing effect on the properties of Ge nanocrystals dispersed in alumina films by means of TEM and ellipsometry P. Caldelas, M. Pereira, S.R.C. Pinto, A.G. Rolo, A. Chahboun, S. Foss, O. Conde, T.G. Finstad, M.J.M. Gomes Abstracts of International Conference on Surfaces, Coatings and Nanostructured Materials, NanoSMat 2007, 09